3. Checking for Component Damage
3-1. Y IPM(IC 15) or Z IPM(IC 2) Damage3-3. FET AssOy(Y B/D: HS1) Damage
(1) When the internal Sustain_IGBT or ER_FET of Y IPM(IC(1) When Set_Up FET is damaged, screen doesnOt be shown
15) or Z IPM(IC 2) is damaged, VS FUSE is open andOTest Point: Enlarge the after measuring GND~B32(Y B/D)
screen doesnOt be shown. OWave format: Set_up waveform does not come out.
OTest Point: B32~GND(Y B/D), B28~GND(Z B/D)
OWave format: B32(Y B/D) or B28(Z B/D)has no outputSet_up waveform
wave. does not come out
<When the Set_Up FET is damaged>
English
(2) When Set_Down FET is damaged, electric discharge of
entire screen is generated.
OTest Point: Enlarge the after measuring GND~B32(Y B/D)
OWave format: Set_down waveform does not come out.
<IPM Normal Output Wave>
OMeasurance position: Sustain section enlarge the after
measuring B32 wave of Y B/D and B28 wave of Z B/D.
(Full White Pattern)
3-2. Pass Top FET(Y B/D: HS2) DamageSet_down waveform
does not come out
(1) When Pass Top FET is damaged, electric discharge of
entire screen is generated. <When the Set_Down FET is damaged>
OTest Point: Enlarge the after measuring GND~B32(Y B/D)
OWave format: When the Set_dn does not descend until
-Vy.
It does not descend until -Vy
<Reset section normal output wave>
<When the Pass Top FET is damaged>
OMeasurance position: Reset section enlargement wave of
B32(Y B/D) (Full White Pattern)
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ACEC
