DEM-9991D(J,K)
DEM-9991D
COVER(
98.4.25
Pin description
0:09
Port NOPort Nam e I/ODescriptionsPort NOPort Nam e I/ODescriptions
59TLDBITest port of IC.1GND�GND (0V).AM
60TCKITest port of IC.2VDD�Power supply (+5V).
61TRPOOutput port of IC test.3RESETISystem reset. L = reset.y[W
62TDOOOutput port of IC test.4OSCONIOscillation control. H = oscillation. L = standby.
63PDOOPhase comparator (3 states)5DATAITest port of IC. 6
64TI4ITest port of IC.6MCKITest port of IC.
65PDDISIOutput control of PDO. L = output.7MLTBITest port of IC.
66MUTOOMuting output. H = mute. Also H = MUTI is OH� or out of synchronous of AC-3.8IDSTOOutput port of IC test.CIRCUIT DESCRIPTION
67TI5ITest port of IC.9IDCKOOutput port of IC test.
68VLDYOOutput port of IC test.10IDOOOutput port of IC test.
69DASYOOOutput port of IC test.11TMOITest port of IC.
70DAOUTODigital out (serial data stream output)12ECCKOOutput port of IC test.
71DAINIExtra input of digital.DASEL = �H� : signal though DAOUT.13DENOOutput port of IC test.
72DASELIChoice of digital output14DEYOOutput port of IC test.
73TI8ITest port of IC.15MSYCOOutput port of IC test.
74C2F1ODisplay of C2 error correction. Output of condition on error correction.16TM1ITest port of IC.
75C2F0ODisplay of C2 error correction. Output of error count on C2.17A0OAddress 0 output of extra RAM (LSB).
76C1F1ODisplay of C1 error correction. Output of error or non-error on C1.18~22A1~5OAddress 1~5 outputs of extra RAM.
77C1F0ODisplay of C1 error correction. Output of error count on C1.23, 24TM2, 3ITest port of IC.
78MUT1IMuting input. H = mute.25XOUTOOutput port of IC test.
79VDD�Power supply (+5V).26, 27XIN / XEXTITest port of IC.
80GND�GND (0V).28GND�GND (0V).
81AVDD�Analog Comparator power supply (+5V)29VDD�Power supply (+5V).
82CPINIAnalog comparator input. Negative port (invert).30, 31A6, 7OAddress 1~5 outputs of extra RAM.
83CMINIAnalog comparator input. Positive port (non-invert:QOSK input).32GND�GND (0V).
84AGND�Analog comparator GND.33VDD�Power supply (+5V).
85TM4ITest port of IC.34A12OAddress 12 outputs of extra RAM.
86VDD�Power supply (+5V).35A14OAddress 14 outputs of extra RAM (MSB).
87DINITest port of IC.36W EBOW rite enable signal of extra RAM. L = active.
88DOUTOAnalog comparator output.37~39A13 / 8, 9OAddress 13, 8, 9 outputs of extra RAM.
89DOUTBOInverted analog comparator output.40GND�GND (0V).
90C9MO9.216MHz output. 1/2 divided output of VIN (55P).41A11OAddress 11 outputs of extra RAM.
91GND�GND (0V).42OEBOOutput enable signal of extra RAM. L = active.
92W INGTOOutput port of IC test.43A10OAddress 10 outputs of extra RAM.
93, 94SYST0, 1OOutput port of IC test.44~51DB7~0I/OData port of extra RAM. Data bus7~0.
95, 96ADST0, 1OOutput port of IC test.52VDD�Power supply (+5V).
97TM5ITest port of IC.53GND�GND (0V).
98BUNRIITest port of IC.54TI1ITest port of IC.
99AGND�GND of 46.08MHz.55VINIVCXO input.
100AVDD�Power supply of 46.08MHz (+5V).56VOUTOVCXO output.
57, 58TI2, 3ITest port of IC.
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ACEC
